Testing two techniques for wavefront analysis. Specific applications and comparative study
S. Vallmitjana, A. Marzoa, S. Bosch, E. Acosta
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Base Information
Volume
V50 - N4 / 2017 Ordinario
Reference
327-335
DOI
http://doi.org/10.7149/OPA.50.4.49022
Language
English
Keywords
Wavefront aberration; Optical testing; Zernike polynomials; Shack-Hartmann; Point diffraction interferometer; Image quality assesment.
Abstract
This work focuses on the description of two different techniques for characterizing wavefronts: by using Shack-Hartmann (SH) sensor and by using Point Diffraction Interferometer (PDI). Moreover describes application examples of each in recent research, and finally a comparative study of both techniques on a single optical system is performed.
References
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